An architecture-based comparison of verification and statistical reliability assessment methods for embedded software systems
| Title | An architecture-based comparison of verification and statistical reliability assessment methods for embedded software systems |
| Publication Type | Conference Paper |
| Year of Publication | 2002 |
| Authors | Bastani, F. B., K. Sung, I. L. Yen, and I. - R. Chen |
| Conference Name | 5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing |
| Date Published | May 2002 |
| Conference Location | Washington DC |