An architecture-based comparison of verification and statistical reliability assessment methods for embedded software systems

TitleAn architecture-based comparison of verification and statistical reliability assessment methods for embedded software systems
Publication TypeConference Paper
Year of Publication2002
AuthorsBastani, F. B., K. Sung, I. L. Yen, and I. - R. Chen
Conference Name5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing
Date PublishedMay 2002
Conference LocationWashington DC