Detecting Spatial Outliers with Multiple Attributes
| Title | Detecting Spatial Outliers with Multiple Attributes |
| Publication Type | Conference Proceedings |
| Year of Conference | 2003 |
| Authors | Lu, C. T., D. Chen, and Y. Kou |
| Conference Name | Proceedings of the 15th International Conference on Tools with Artificial Intelligence |
| Pagination | 122-128 |
| Date Published | Nov |
| Conference Location | Sacramento, California |