Using External High-Resolution Log Scanning to Determine Internal Defect Characteristics
| Title | Using External High-Resolution Log Scanning to Determine Internal Defect Characteristics |
| Publication Type | Conference Paper |
| Year of Publication | 2006 |
| Authors | Thomas, E., L. Thomas, C. A. Shaffer, and L. Mili |
| Conference Name | Proceedings of the 15th Central Hardwood Forestry Conference |
| Date Published | February |